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Semiconductor devices. Constant current electromigration test Ingestion-build-156411 The protocol specific definitions are
Semiconductor devices. Constant current electromigration test Ingestion-build-156411 The protocol specific definitions are
$142.00
Description
The protocol specific definitions are based on FF-Specifications for H1 and HSE protocols
(Note that the categories L1 to L7 include 2-
dynamic or internal stresses)
Shape and size
Replaces BS 5588-4:1998 and specifies pressure differential systems designed to hold back smoke at a leaky physical barrier in a building
Semiconductor devices. Constant current electromigration test Ingestion-build-156411 The protocol specific definitions are1 Scope This standard describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
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