Optics and photonics. Microlens arrays - Test methods for wavefront aberrations included-in-kit annex B of [ISO 11072]

annex B of [ISO 11072] describes how imaging fits within the general framework of that model

no damage including corrosion of the metal parts shall be evident

Manufacturers of coupling devices

then the tests are carried out with them in place

method A is applicable

Optics and photonics. Microlens arrays - Test methods for wavefront aberrations included-in-kit annex B of [ISO 11072]1 Scope This part of ISO 14880 specifies methods for testing wavefront aberrations for microlenses within microlens arrays. It is applicable to microlens arrays with very small lenses formed inside or on one or more surfaces of a common substrate.