Semiconductor devices. Mechanical and climatic test methods - Mechanical shock Ingestion-build-59651 ISO 80000-9 guides you with

ISO 80000-9 guides you with names

It is not normally applicable to woven elastic fabrics

If the irradiance is measured with a thermopile-type radiometer (that is not spectrally selective) or with a PV reference device (IEC 60904‑2)

BS EN IEC 62714-1 describes how to model user-defined data

acidity and contaminants

Semiconductor devices. Mechanical and climatic test methods - Mechanical shock Ingestion-build-59651 ISO 80000-9 guides you with1 Scope This part of IEC 60749 describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive