Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-64721 not exceeding (60 ± 3)

not exceeding (60 ± 3) km/h

This British Standard supersedes BS 5703-1:1980

PD CEN/TR 15449-1 is the first part of the multiple series document that provides a reference model for a Spatial Data Infrastructure (SDI)

— TPEG physical format for ALERT-C (TMC) location references (Annex B

b) to establish the performance limits of the system

Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-64721 not exceeding (60 ± 3)What is BS EN IEC 60749 13 Salt atmosphere test for semiconductor devices about? BS EN IEC 60749 is an international standard on semiconductor devices. BS EN IEC 60749 13 is the 13th part of the series that describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea coast atmosphere on all exposed surfaces. BS EN IEC 60749 13 is only