JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working Removed from a Nikon NSR-S307E

Removed from a Nikon NSR-S307E DUV Scanning System This Nikon RBP-M16/MX4B1 Backplane Board PCB is used working surplus

5080-192750-12: X-AXIS

System Sub-Assembly: Beam Focus Stage

Inventory # 19407

Model No: A/F LED DRIVER

JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working Removed from a Nikon NSR-S307EJEOL Secondary Electron Detector JWS 2000 Wafer Defect Review SEM Working Part No: Secondary Electron Detector Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 12"x12"x12" @ 3 lbs. Only items