JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM Working Removed from a KLA-Tencor AIT

Removed from a KLA-Tencor AIT Fusion UV Dark Field Wafer Particle Inspection System Installed Components

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AMAT Applied Materials Part No: 0190-28862

Inventory # CONJ-1934

Part No: Y5304900

JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM Working Removed from a KLA-Tencor AITJEOL Column Electron Detector Assembly JWS 2000 Wafer Defect Review SEM Working Part No: Electron Detector Assembly Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Column Detector Assembly is working surplus. Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling. Sale Details Item