G02300 - SEMI G23 - 半導体パッケージの内部導体路のインダクタンスのための試験方法 StdPbc-0924 previously published July 2013
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Description
previously published July 2013
10-0600 (Reapproved 0124)
The rinse test method evaluates performance in a flushing mode while the component is in a static state (no actively moving components within the component under test)
It does not mandate specific solutions to address the identified technical requirements because there are multiple implementation choices that meet these requirements
• Ammonia (NH3)
G02300 - SEMI G23 - 半導体パッケージの内部導体路のインダクタンスのための試験方法 StdPbc-0924 previously published July 2013global Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org198019969 Referenced SEMI Standards None.
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