S02700 - SEMI S27 - 針對環境、安全與衛生(ESH)評估報告內容之安全指導方針 StdPbc-0211 equipment and facilities relating to

equipment and facilities relating to manufacturing

静電気による装置動作上の問題と製品欠陥の増加は，半導体製造装置の所有コスト（COO： cost of ownership）へのマイナス要因となる（SEMI E35を参照のこと）。

the array coordinate system may be referenced to the physical geometry of the wafer

dry Si wafers that are supported by a mechanism that move the test specimen through the measurement equipment

Application of this Test Method is limited to specimens that have discrete

S02700 - SEMI S27 - 針對環境、安全與衛生(ESH)評估報告內容之安全指導方針 StdPbc-0211 equipment and facilities relating to(Environmental Health & Safety Technical Committee)2009121620102www. semi. org SEMI(ME) SEMI Referenced SEMI Standards SEMI S2 Environmental, Health, and Safety Guideline for Semiconductor Manufacturing Equipment SEMI S7 Safety Guideline for Evaluation Personnel and Evaluating Company Qualifications SEMI S8 Safety Guidelines for Ergonomics Engineering of Semiconduct