P02600 - SEMI P26 - フォトレジストの感度測定用パラメータチェックリスト StdTpc-Sapphire SEMI C96-0618 (first published)
$115.50
Description
SEMI C96-0618 (first published)
orgで入手可能となる。初版は1989年発行。前版は2003年3月発行。
it has become of interest to standardize additional properties of the wafers
bases and oxidizers
SEMI E99-1000E (editorial revision)
P02600 - SEMI P26 - フォトレジストの感度測定用パラメータチェックリスト StdTpc-Sapphire SEMI C96-0618 (first published)NOTICE: This translation is a REFERENCE COPY ONLY. If differences should exist between the English version and a translation in any other language, the English version is the official and authoritative version. SEMI SEMI Global Micropatterning CommitteeJapanese Micropatterning Committee2003428Japanese Regional Standards Committee20036www. semi. org200371996 NOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to
Shipping Notes
- Free Standard Shipping on $100+ Orders to the USA.
- Except Preorder products are shipped in 48 hours.
- Delivery to the USA:
- Standard Shipping : 3-10 business days
- If time is of the essence, please consider selecting expedited delivery for faster service.