D07900 - SEMI D79 - Test Method for Local and Overall Flicker of Flexible Displays Revision:SEMI D79-0421 - Current orgで入手可能となる。初版は1993年発行。

orgで入手可能となる。初版は1993年発行。

SEMI MF81-1105 (Reapproved 0611)

these technologies demand higher precision wafers and more accurate depiction of the true topography of the wafer

1  SEMI M52 requires the use of certified reference materials (CRMs) for calibration of scanning surface inspection systems (SSISs)

SEMI 3D13 — Guide for Measuring Voids in Bonded Wafer Stacks

D07900 - SEMI D79 - Test Method for Local and Overall Flicker of Flexible Displays Revision:SEMI D79-0421 - Current orgで入手可能となる。初版は1993年発行。This Standard specifies flicker measurement conditions and methods for describing the visual perception in flicker for flexible display. The flexible display shows green pattern of full screen. The measured conditions include the flat and the curved surface, and the curvature of the curved surface is defined explicitly. Flicker has been widely used for evaluating display. Follow the calculated procedures in VESA standard, the experimental results are