F03800 - SEMI F38 - Test Method for Efficiency Qualification of Point-of-Use Gas Filters StdPbc-0623 Peel strength of protective film

Peel strength of protective film from leadframe tape (see SEMI G75

1  The scope of this Standard is automated material processing based on discrete processing jobs

The CIE XYZ color space is derived from the experimental results and it has been used to set color performance of displays in CIE xy or u’v’ chromaticity diagram without brightness

cleaved wafers can be accepted as long as it does not cause a significant drop in the sensitivity (from a quarter to a half of a wafer)

SEMI E112-1017 (technical revision)

F03800 - SEMI F38 - Test Method for Efficiency Qualification of Point-of-Use Gas Filters StdPbc-0623 Peel strength of protective filmNOTICE: This Document was completely rewritten in 2019. The purpose of this Document is to define a comprehensive standard test sequence to qualify the particle filtration efficiency achievable using point of use (POU) gas filters. This Test Method defines an evaluation method for POU filters of various media (e. g., metallic, ceramic, and polymeric) typically used for filtering inert and process gases in semiconductor applications. POU filters are