SiC Webinar June 2023 - On Demand StdTpc-Jig ID It does not cover the

It does not cover the traceability of any product through the supply chain

the specimen need not be cut into a special shape

·        搬送用カセットとボックスとの間

and Thickness Variation on Silicon Wafers by Automated Noncontact ScanningSEMI MF2074 — Guide for Measuring Diameter of Silicon and Other Semiconductor WafersSEMI T7 — Specification for Back Surface Marking of Double-Side Polished Wafers with a Two-Dimensional Matrix Code Symbol

• extract the edge profile characteristic parameters by fitting lines or arcs to portions of the measured edge profile at defined distances from the periphery of the wafer and compare them with the specified values

SiC Webinar June 2023 - On Demand StdTpc-Jig ID It does not cover the