D07700 - SEMI D77 - Test Method for Measurements of Dimension of Films for FPD – Contour Matching Method Revision:SEMI D77-0618 - Superseded Determining the electrical length of

Determining the electrical length of RF cable assemblies at the nominal operating frequency in terms of degrees of phase shift

1  This Standard starts with the basic and most necessary terms which are used in 3D display (especially for those different from 2D displays)

which will

terms used to describe the characteristics of the edge profile of silicon wafers are named and their meaning is illustrated by a schematic drawing

NOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met

D07700 - SEMI D77 - Test Method for Measurements of Dimension of Films for FPD – Contour Matching Method Revision:SEMI D77-0618 - Superseded Determining the electrical length ofThis Standard establishes the method that evaluates with high precision a shape of the polarizing films and other films for FPD, especially non rectangle shape films. This Standard specifies the measurement method of polarizing films and other films for FPD by using contour matching method. This Standard can apply to rectangle shapes. Especially non rectangle shapes are effective. Examples of the other films except polarizing films are retardation